failure analysis
Once a product has been design and prototype devices manufactured customers will typically want to ensure that the design, materials and assembly processes are fit for purpose. This will typically involve putting the parts through some level of environmental and functional testing. After this stage it is important that any failure modes are identified and understood and feedback quickly to the design and process stages. Failure analysis also offers the advantage of
Optocap offers Microfocus Xray service to enable an understanding of design and process improvements. Click below for more information on:
Additionally Optocap has partnerships with local companies who offer other failure analysis services such as:
Scanning Electron Microscopy (SEM)
Energy Dispersive Spectroscopy (EDS)
Fourier Transform Infra-Red Spectroscopy (FT-IR)
Secondary Ion Mass Spectrometry (SIMS)
X-ray Photoelectron Spectroscopy (XPS)